18 August 2005 Developments in the realization of diffuse reflectance scales at NPL
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Proceedings Volume 5880, Optical Diagnostics; 58800V (2005); doi: 10.1117/12.620268
Event: Optics and Photonics 2005, 2005, San Diego, California, United States
Abstract
The United Kingdom scales for diffuse reflectance are realized using two primary instruments. In the 360 nm to 2.5 μm spectral region the National Reference Reflectometer (NRR) realizes absolute measurement of reflectance and radiance factor by goniometric measurements. Hemispherical reflectance scales are obtained through the spatial integration of these goniometric measurements. In the mid-infrared region (2.5 μm - 55 μm) the hemispherical reflectance scale is realized by the Absolute Hemispherical Reflectometer (AHR). This paper describes some of the uncertainties resulting from errors in aligning the NRR and non-ideality in sample topography, together with its use to carry out measurements in the 1 - 1.6 μm region. The AHR has previously been used with grating spectrometers, and has now been coupled to a Fourier transform spectrometer.
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Christopher J. Chunnilall, Frank J. J. Clarke, Michael J. Shaw, "Developments in the realization of diffuse reflectance scales at NPL", Proc. SPIE 5880, Optical Diagnostics, 58800V (18 August 2005); doi: 10.1117/12.620268; https://doi.org/10.1117/12.620268
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KEYWORDS
Sensors

Reflectivity

Spectrometers

Reflectometry

Error analysis

Mirrors

Diffuse reflectance spectroscopy

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