18 August 2005 Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis
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Abstract
One of the visual problems hardest to recognize in liquid crystal displays (LCDs) is an area of non-uniform brightness called a mura. The accurate and consistent detection of a low-contrast mura is extremely difficult because the boundary between the regional mura and the background is indistinct. This paper presents a novel method for detection and quantitative measurement of low-contrast mura. Compared with some wavelet approaches, the multiple resolution analysis method based on the Symmetric Selesnick multiwavelet has advantages for practical use.
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Hiroki Nakano, Hiroki Nakano, Yumi Mori, Yumi Mori, } "Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis", Proc. SPIE 5880, Optical Diagnostics, 588013 (18 August 2005); doi: 10.1117/12.616232; https://doi.org/10.1117/12.616232
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