Paper
30 August 2005 Modeling contamination migration on the Chandra X-ray Observatory
Stephen L. O'Dell, Douglas A. Swartz, Paul P. Plucinsky, Mark A. Freeman, Maxim L. Markevitch, Alexey A. Vikhlinin, Kenny C. Chen, Rino J. Giordano, Perry J. Knollenberg, Peter A. Morris, Hien Tran, Neil W. Tice, Scot K. Anderson
Author Affiliations +
Abstract
During its first 6 years of operation, the cold (-60°C) optical blocking filter of the Advanced CCD Imaging Spectrometer (ACIS), on board the Chandra X-ray Observatory, has accumulated a contaminating layer that attenuates the low-energy x rays. To assist in assessing the likelihood of successfully baking off the contaminant, members of the Chandra team developed contamination-migration simulation software. The simulation follows deposition onto and (temperature-dependent) vaporization from surfaces comprising a geometric model of the Observatory. A separate thermal analysis, augmented by on-board temperature monitoring, provides temperatures for each surface of a similar geometric model. This paper describes the physical basis for the simulations, the methodologies, and the predicted migration of the contaminant for various bake-out scenarios and assumptions.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen L. O'Dell, Douglas A. Swartz, Paul P. Plucinsky, Mark A. Freeman, Maxim L. Markevitch, Alexey A. Vikhlinin, Kenny C. Chen, Rino J. Giordano, Perry J. Knollenberg, Peter A. Morris, Hien Tran, Neil W. Tice, and Scot K. Anderson "Modeling contamination migration on the Chandra X-ray Observatory", Proc. SPIE 5898, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV, 589813 (30 August 2005); https://doi.org/10.1117/12.619310
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KEYWORDS
Optical resonators

Contamination

Observatories

Solids

Thermal analysis

X-rays

Liquids

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