17 September 2005 Maxbeam2: a new method of identifying salient Beamlets
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Proceedings Volume 5914, Wavelets XI; 591426 (2005) https://doi.org/10.1117/12.619446
Event: Optics and Photonics 2005, 2005, San Diego, California, United States
Abstract
Beamlet processing is a powerful and flexible approach to the identification of line based structures in data. The processing method is efficient (O(n2)) and also robust to variation in direction of the line continuation. This paper identifies two weaknesses with the current approach: the inability to identify lines at variable intensity, and with variation in width. These are addressed with a simple modification to the process used in selecting the salient beamlets called maxbeam2. This is demonstrated on a line image with variation in signal intensity and line width. The technique appears to correct the above weaknesses with only a small amount of extra processing, and hence make beamlets more generally applicable.
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Jonathan Edwards, Jim Nicholson, Simon O'Keefe, "Maxbeam2: a new method of identifying salient Beamlets", Proc. SPIE 5914, Wavelets XI, 591426 (17 September 2005); doi: 10.1117/12.619446; https://doi.org/10.1117/12.619446
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