30 August 2005 Coherent diffractive imaging using focused beams
Author Affiliations +
Abstract
It is well-known that the loss of phase information at detection means that a diffraction pattern may be consistent with a multitude of physically different structures. This paper shows that it is possible to perform unique structural determination in the absence of a-priori information using x-ray fields with phase curvature. We argue that significant phase curvature is already available using modern x-ray optics and we demonstrate an algorithm that allows the phase to be recovered uniquely and reliably.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Keith A. Nugent, Keith A. Nugent, Andrew G. Peele, Andrew G. Peele, Harry M. Quiney, Harry M. Quiney, } "Coherent diffractive imaging using focused beams", Proc. SPIE 5917, Fourth Generation X-Ray Sources and Optics III, 59170A (30 August 2005); doi: 10.1117/12.621992; https://doi.org/10.1117/12.621992
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT

X-ray diffraction optics of the submicron surface layers
Proceedings of SPIE (November 09 1995)
Time-resolved crystallography on p21H-ras
Proceedings of SPIE (August 31 1995)
Femtosecond coherent control of x-rays
Proceedings of SPIE (January 27 2004)
Femtosecond x-ray diffraction: experiments and limits
Proceedings of SPIE (January 24 2001)

Back to Top