13 September 2005 Soft x-ray laser interferometry unveils plasmas with index of refraction greater than one
Author Affiliations +
Abstract
We report clear evidence of the existence of multiply ionized plasmas with index of refraction greater than one at soft x-ray wavelengths. Moreover, it is shown to be a general phenomenon affecting broad spectral regions in numerous highly ionized plasmas. The experimental evidence consists of the observation of anomalous fringe shifts in soft x-ray laser interferograms of laser-created Al plasmas probed at 14.7 nm and of Ag and Sn laser-created plasmas probed at 46.9 nm. The comparison of measured and simulated interferograms shows that these anomalous fringe shifts result from the dominant contribution of low charge ions to the index of refraction. This usually neglected bound electron contribution can affect the propagation of soft x-ray radiation in plasmas and the interferometric diagnostics of plasmas for many elements and at different wavelengths.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Filevich, J. Filevich, J. Grava, J. Grava, M. Purvis, M. Purvis, J. J. Rocca, J. J. Rocca, M. C. Marconi, M. C. Marconi, S. J. Moon, S. J. Moon, J. Nilsen, J. Nilsen, J. H. Scofield, J. H. Scofield, J. Dunn, J. Dunn, R. F. Smith, R. F. Smith, R. Keenan, R. Keenan, J. R. Hunter, J. R. Hunter, V. N. Shlyaptsev, V. N. Shlyaptsev, } "Soft x-ray laser interferometry unveils plasmas with index of refraction greater than one", Proc. SPIE 5919, Soft X-Ray Lasers and Applications VI, 59190O (13 September 2005); doi: 10.1117/12.617229; https://doi.org/10.1117/12.617229
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT


Back to Top