16 September 2005 Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories
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This paper presents the first series of round-robin metrology measurements of x-ray mirrors organized at the Advanced Photon Source (APS) in the USA, the European Synchrotron Radiation Facility in France, and the Super Photon Ring (SPring-8) (in a collaboration with Osaka University,) in Japan. This work is part of the three institutions' three-way agreement to promote a direct exchange of research information and experience amongst their specialists. The purpose of the metrology round robin is to compare the performance and limitations of the instrumentation used at the optical metrology laboratories of these facilities and to set the basis for establishing guidelines and procedures to accurately perform the measurements. The optics used in the measurements were selected to reflect typical, as well as state of the art, in mirror fabrication. The first series of the round robin measurements focuses on flat and cylindrical mirrors with varying sizes and quality. Three mirrors (two flats and one cylinder) were successively measured using long trace profilers. Although the three facilities' LTPs are of different design, the measurements were found to be in excellent agreement. The maximum discrepancy of the rms slope error values is 0.1 μrad, that of the rms shape error was 3 nm, and they all relate to the measurement of the cylindrical mirror. The next round-robin measurements will deal with elliptical and spherical optics.
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Lahsen Assoufid, Lahsen Assoufid, Amparo Rommeveaux, Amparo Rommeveaux, Haruhiko Ohashi, Haruhiko Ohashi, Kazuto Yamauchi, Kazuto Yamauchi, Hidekazu Mimura, Hidekazu Mimura, Jun Qian, Jun Qian, Olivier Hignette, Olivier Hignette, Tetsuya Ishikawa, Tetsuya Ishikawa, Christian Morawe, Christian Morawe, Albert Macrander, Albert Macrander, Ali Khounsary, Ali Khounsary, Shunji Goto, Shunji Goto, } "Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories", Proc. SPIE 5921, Advances in Metrology for X-Ray and EUV Optics, 59210J (16 September 2005); doi: 10.1117/12.623209; https://doi.org/10.1117/12.623209


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