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16 September 2005 Evaluation of properties of various type CdTe hard x-ray detectors
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Abstract
M-π -n detector and Schottky detector which were different barriers were evaluated by measuring spectrum as imaging detectors. These spectrum performances showed that the effect of polarization in these detectors was similarly occurred. The current-time characteristics and capacitance-time characteristics were measured for the detectors and it was found that these characteristics were due to the effect of polarization.
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Asuka Togami, Yu Ishida, Toru Aoki, Yoshinori Hatanaka, and Jiro Temmyo "Evaluation of properties of various type CdTe hard x-ray detectors", Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 592210 (16 September 2005); https://doi.org/10.1117/12.620071
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