14 September 2005 μ-PIXE and X-PIXE for radiological forensics
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Sandia is evaluating methods for identifying and quantifying trace signatures in field collection samples to support national deterrence policies. The first step in this process is to identify which combination of major, minor, and trace elements in a recovered collection sample provides the most reliable forensic information, and then to be able to quickly, accurately, and, in some cases, nondestructively measure these components. Conventional approaches have typically required a long, complex series of sample preparations followed by radiochemical analysis, often yielding only qualitative results. We report on our investigations to assess accelerator-based ion beam analysis methods by cross-calibrating with other methods, performing in-air analyses of bagged samples in anticipation of inspecting poorly constituted radioactive materials, and quantifying the uncertainties for detected elements.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paula Provencio, Paula Provencio, Barney Doyle, Barney Doyle, Arlyn Antolak, Arlyn Antolak, Daniel Morse, Daniel Morse, Charles Richardson, Charles Richardson, "μ-PIXE and X-PIXE for radiological forensics", Proc. SPIE 5923, Penetrating Radiation Systems and Applications VII, 592304 (14 September 2005); doi: 10.1117/12.625265; https://doi.org/10.1117/12.625265


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