Paper
18 August 2005 Tailoring interfacial properties of periodic mesoporous organosilicas by incorporation of spacious heterocyclic and thiol groups and its implication for structural changes
Oksana Olkhovyk, Stanislaw Pikus, Mietek Jaroniec
Author Affiliations +
Abstract
The current study highlights the possibility of fine-tuning the chemistry and structure of periodic mesoporous organosilica (PMO) upon incorporation of large heterocyclic bridging group, tris[3-(trimethoxysilyl)propyl]isocyanurate (ICS), into its framework. This PMO was prepared by direct co-condensation of ICS and tetraethylorthosilicate (TEOS)in the presence of block copolymer used as structure directing agent. It was shown that up to a relatively high percentage of ICS a hexagonally ordered mesostructure with P6mm symmetry is formed. The co-condensation of ICS, TEOS and (3-mercaptopropyl)trimethoxysilane (SH) in the presence of poly(ethylene)-poly(propylene)-poly(ethylene) block copolymer afforded novel PMO with isocyanurate groups in the framework and mercaptopropyl groups on the surface of mesopores. It was surprising to find that the structure symmetry of this bifunctional PMO was not hexagonal but cubic. This structural change was induced by addition of another organosilane to the synthesis gel that afforded PMO with I4132 symmetry. Nitrogen adsorption, thermogravimetry, and small angle X-ray scattering were employed to monitor structural and interfacial changes of the PMO studied.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oksana Olkhovyk, Stanislaw Pikus, and Mietek Jaroniec "Tailoring interfacial properties of periodic mesoporous organosilicas by incorporation of spacious heterocyclic and thiol groups and its implication for structural changes", Proc. SPIE 5929, Physical Chemistry of Interfaces and Nanomaterials IV, 59290Z (18 August 2005); https://doi.org/10.1117/12.616834
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Adsorption

Nitrogen

Silica

X-rays

Natural surfaces

Scattering

Statistical analysis

Back to Top