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18 August 2005 Near field optical tweezers
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In this paper, we report on near field optical tweezers using focused evanescent illumination. The intensity pattern of the focused evanescent field has been characterized using a SNOM. The near field trapping efficiency has been experimentally and theoretically investigated using both TEM00 and TEM01 beams. The trapping efficiency was found to be polarization dependent and also changed for the two modes of illumination used. By incorporating the near field and far field optical tweezers one could construct an optical micromanipulation setup with great flexibility and accuracy, which would find applications in optical nanometry. By coupling the techniques like morphology dependent resonance (MDR), one could employ near field tweezers for near field sensing and for characterization of microfluidic channels.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Smitha Kuriakose, Dru Morrish, Baohua Jia, James W. M. Chon, Xiasong Gan, and Min Gu "Near field optical tweezers", Proc. SPIE 5930, Optical Trapping and Optical Micromanipulation II, 59300Q (18 August 2005); doi: 10.1117/12.618617;


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