26 August 2005 Submicron particle localization using evanescent field
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Abstract
Recently a non-contact organization of submicron colloidal particles on the surface attracted a great attention in connection with development of imaging techniques using total internal reflection. We focus here on the theoretical description of the forces acting on a submicron particle placed in an interference field created by two counter-propagating evanescent waves. Numerical results elucidate how these forces or trap depth depend on the particle size and angle of incidence of both beams. Experimental results proved these conclusions and several polystyrene particles of diameter 520 nm were confined in evanescent standing wave.
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Martin Siler, Martin Siler, Mojmir Sery, Mojmir Sery, Tomas Cizmar, Tomas Cizmar, Pavel Zemanek, Pavel Zemanek, } "Submicron particle localization using evanescent field", Proc. SPIE 5930, Optical Trapping and Optical Micromanipulation II, 59300R (26 August 2005); doi: 10.1117/12.615741; https://doi.org/10.1117/12.615741
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