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9 October 2005 Analysis of trap distribution for smectic liquid crystals using time of flight spectroscopy
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Abstract
We analyzed the experimental time-of-flight data for photoinjected holes in two smectic liquid crystals, the first consisting of a phenylnaphthalene derivative 8PNPO12, and the second consisting of a biphenyl derivative 6OBP6. We fit the time of flight transients for different electric field strengths to a multiple trapping model (MTM). From these fits we determined the distribution of trap depths, under the assumption that (i) linear response is valid, and (ii) the trap release rates are independent of field.
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Akira Ohno, Hiroaki Iino, Kensuke Kurotaki, Akihide Haruyama, Jun-ichi Hanna, and David H. Dunlap "Analysis of trap distribution for smectic liquid crystals using time of flight spectroscopy", Proc. SPIE 5937, Organic Light-Emitting Materials and Devices IX, 59371X (9 October 2005); https://doi.org/10.1117/12.617632
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