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6 December 2006 Digital two-wavelength holographic interference microscopy for surface roughness measurement
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Proceedings Volume 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; 59450I (2006) https://doi.org/10.1117/12.638915
Event: 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2005, Nitra, Slovakia
Abstract
A new approach to surface roughness measurement based on the digital two-wavelength holographic interference microscopy with the synthetic wavelength is presented. Two holograms of a randomly rough surface are recorded step by step at two wavelengths by means of a CCD camera. Both holograms are numerically reconstructed. Two reconstructed waves obtained numerically interfere. The surface roughness parameters may be determined from the interferogram.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Miloslav Ohlídal, Ludek Šír, Miloš Jákl, and Ivan Ohlídal "Digital two-wavelength holographic interference microscopy for surface roughness measurement", Proc. SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 59450I (6 December 2006); https://doi.org/10.1117/12.638915
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