13 June 2006 InGaAsP laser diode quality investigation and their noise characteristics
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Proceedings Volume 5946, Optical Materials and Applications; 594613 (2006) https://doi.org/10.1117/12.639409
Event: Optical Materials and Applications, 2005, Tartu, Estonia
Electrical and optical low frequency noise characteristics of different quality InGaAsP Fabry-Perot and distributed feedback buried-heterostructure 1.55-μm laser diodes with the multiple-quantum-well active region are investigated keeping in view the use of the peculiarities of the characteristics for the assessment of the quality and reliability of LDs. The noise characteristics are shown to give the most informative result when measured at the threshold. In parallel to the noise measurements the current-voltage characteristics are measured and analyzed. In the use of this combination an alternative to the reliability tests by accelerated aging is seen. The mode hopping effect exhibited by the Fabry-Perot laser diodes is suppressed by the facet coating with an antireflection layer.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonas Matukas, Jonas Matukas, Vilius Palenskis, Vilius Palenskis, Sandra Pralgauskaitė, Sandra Pralgauskaitė, Ričardas Sobiestijanskas, Ričardas Sobiestijanskas, Emilis Šermukšnis, Emilis Šermukšnis, } "InGaAsP laser diode quality investigation and their noise characteristics", Proc. SPIE 5946, Optical Materials and Applications, 594613 (13 June 2006); doi: 10.1117/12.639409; https://doi.org/10.1117/12.639409

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