Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films

P. Adamson

doi:10.1117/12.639320

13 June 2006 Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films

P. Adamson

Author Affiliations +

Proceedings Volume 5946, Optical Materials and Applications; 594617 (2006) https://doi.org/10.1117/12.639320
Event: Optical Materials and Applications, 2005, Tartu, Estonia

Abstract

The reflection of s- or p-polarized electromagnetic plane waves from an N-layer system of inhomogeneous ultrathin dielectric films in the vicinity of the classical Brewster angle is investigated analytically in the long-wavelength limit. The second-order approximate formulas for principal and polarizing angles are derived and their accuracy is estimated by using exact numerical methods for calculating the reflection characteristics of inhomogeneous films. It is shown that expressions obtained for characteristic reflection angles are of immediate interest to the solution of the inverse problem for nanoscopic-layered structures. A few novel straightforward methods for optical diagnostics of ultrathin layers are established.

Citation Download Citation

P. Adamson "Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films", Proc. SPIE 5946, Optical Materials and Applications, 594617 (13 June 2006); https://doi.org/10.1117/12.639320

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