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11 October 2005 Studies of the degradation mechanisms in high-power diode lasers using multi-channel micro-thermography
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Abstract
We demonstrate the applicability of imaging thermography for investigations of mechanisms associated with gradual degradation in diode lasers. The introduction of two spectral channels provides the means for separate observation of deep level luminescence and thermal radiation emitted according to Planck's law. In the near IR region we found the signal detected by the camera to be mainly affected by mid-gap deep-level luminescence. An intensity increase of the luminescence signal for an aged diode laser compared to an unaged device is noticed. It can be explained by an increase of deep level defect concentration during the aging. In the mid IR, we mainly encounter thermal radiation, which can be used for the analysis of the thermal properties of devices. In present work the thermal behavior of the device subjected to an aging of 3000 hours is analyzed. A significant increase of device temperature is noticed.
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Anna Kozłowska, Jens W. Tomm, Piotr Wawrzyniak, Andrzej Maląg, Fritz Weik, and Mateusz Latoszek "Studies of the degradation mechanisms in high-power diode lasers using multi-channel micro-thermography", Proc. SPIE 5958, Lasers and Applications, 59580X (11 October 2005); https://doi.org/10.1117/12.622677
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