How the stiffness of the optical trap depends on the proximity of the dielectric interface

Petr Jákl; Mojmír Šerý; Miroslav Liška; Pavel Zemánek

doi:10.1117/12.622988

11 October 2005 How the stiffness of the optical trap depends on the proximity of the dielectric interface

Petr Jákl, Mojmír Šerý, Miroslav Liška, Pavel Zemánek

Proceedings Volume 5958, Lasers and Applications; 59582P (2005) https://doi.org/10.1117/12.622988
Event: Congress on Optics and Optoelectronics, 2005, Warsaw, Poland

Abstract

When a probe confined in a single focused laser beam approaches the surface, it is getting more influenced by the retroreflected beam. This beam interferes with the incident one and a weak standing wave (SW) is created, which slightly modulates the incident beam. We studied experimentally how this phenomena influences the optical trap properties if SW is created using surfaces of two different reflectivities. We used polystyrene probes of diameters 690 nm and 820 nm, tracked their positions with quadrant photodiode (QPD) and analysed their thermal motion to get the axial trap stiffness along optical axis.

Citation Download Citation

Petr Jákl, Mojmír Šerý, Miroslav Liška, and Pavel Zemánek "How the stiffness of the optical trap depends on the proximity of the dielectric interface", Proc. SPIE 5958, Lasers and Applications, 59582P (11 October 2005); https://doi.org/10.1117/12.622988

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