4 October 2005 Fourier Transform estimation of reflecting thin film thickness
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A parallel was recently established between an empirical procedure for the estimation of reflecting thin film thickness and new results derived from a Fourier Transform (FT) thin film synthesis technique. For simplicity the proposed FT approach was limited to a particular case. The approach is generalized in the present work and practical considerations are discussed. It is shown that good results are possible although the generalized problem is more complex from the FT point of view.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre G. Verly, Pierre G. Verly, } "Fourier Transform estimation of reflecting thin film thickness", Proc. SPIE 5963, Advances in Optical Thin Films II, 596306 (4 October 2005); doi: 10.1117/12.626713; https://doi.org/10.1117/12.626713


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