14 October 2005 Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements
Author Affiliations +
Abstract
The evaluation of technological parameters is of primary importance for the detector industry, since it allows both to validate the fabrication process and to optimize the electro-optical characteristics of the detectors. By measuring the spectral response of detectors with a high resolution, it is possible to display specific optical effects. Using a radiometric model of the detecting architecture, we are able to understand their physical origins and to determinate some technological and optical parameters. We have developed a test bench which provides spectral responses of infrared detectors using a Fourier transform spectrometer. The principle of the test bench and the methodology used are detailed. Experimental results, as well as the associated radiometric model, are presented for a dedicated 320×240 MCT LWIR focal plane arrays (FPAs).
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sylvain Rommeluère, Nicolas Guérineau, Joël Deschamps, Eric De Borniol, Alain Million, Jean-Paul Chamonal, Gérard Destefanis, "Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements", Proc. SPIE 5964, Detectors and Associated Signal Processing II, 59640E (14 October 2005); doi: 10.1117/12.626301; https://doi.org/10.1117/12.626301
PROCEEDINGS
12 PAGES


SHARE
RELATED CONTENT

Low dark current LWIR HgCdTe focal plane arrays at AIM
Proceedings of SPIE (May 12 2016)
Multicolor focal plane array detector technology: a review
Proceedings of SPIE (November 10 2003)
640 x 480 PACE HgCdTe FPA
Proceedings of SPIE (December 10 1992)
Two-color HgCdTe infrared staring focal plane arrays
Proceedings of SPIE (December 08 2003)

Back to Top