14 October 2005 Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements
Author Affiliations +
Abstract
The evaluation of technological parameters is of primary importance for the detector industry, since it allows both to validate the fabrication process and to optimize the electro-optical characteristics of the detectors. By measuring the spectral response of detectors with a high resolution, it is possible to display specific optical effects. Using a radiometric model of the detecting architecture, we are able to understand their physical origins and to determinate some technological and optical parameters. We have developed a test bench which provides spectral responses of infrared detectors using a Fourier transform spectrometer. The principle of the test bench and the methodology used are detailed. Experimental results, as well as the associated radiometric model, are presented for a dedicated 320×240 MCT LWIR focal plane arrays (FPAs).
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sylvain Rommeluère, Sylvain Rommeluère, Nicolas Guérineau, Nicolas Guérineau, Joël Deschamps, Joël Deschamps, Eric De Borniol, Eric De Borniol, Alain Million, Alain Million, Jean-Paul Chamonal, Jean-Paul Chamonal, Gérard Destefanis, Gérard Destefanis, } "Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements", Proc. SPIE 5964, Detectors and Associated Signal Processing II, 59640E (14 October 2005); doi: 10.1117/12.626301; https://doi.org/10.1117/12.626301
PROCEEDINGS
12 PAGES


SHARE
Back to Top