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15 October 2005 Failure analysis of PC MCT caused by current
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Abstract
The influence of larger constant current burning was studied and analyses on the failed detectors were given. "1/f" noise is observed in the reign of g-r noise, and the exponential factor had a trend of increasing with burning time. Peak wavelength and cutoff wavelength of the detectors had no apparent change during electrical burning, but there were decreases on the short wavelength side in spectral response. After a long time burning, minority carrier lifetime of the detectors decreased as well as black-body signals. Analyses showed that defects increased at the surface of detectors after burning, which was responsible for decreasing the detector performance, even detector failure.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dafu Liu, Ligang Wu, Yonggang Yuan, Lianmei Zhang, Xiufang Jin, and Haimei Gong "Failure analysis of PC MCT caused by current", Proc. SPIE 5964, Detectors and Associated Signal Processing II, 596415 (15 October 2005); https://doi.org/10.1117/12.625046
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