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19 October 2005 Dynamic holography for the space qualification of large reflectors
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The next generation of infrared - sub mm space telescopes requires reflectors with large dimensions, high quality and, according to weight issues, are based on composite or new materials technology. The challenging tasks of on-ground testing are to achieve the required accuracy in the measurement of these reflectors shape and antenna structures and to verify their performance under simulated space conditions (vacuum, low-high temperatures). A holographic camera for the verification and validation of this type of reflector in a space environment is presented. A diffuser is implemented to measure the deformations of reflective surfaces in a more flexible way. The system has been made compatible with the vacuum conditions. Some elements of the holographic camera (camera lenses, CCD, crystal, optical fibre) have been adapted and tested under vacuum. The metrological certification of the whole system is realised by the measurement of a parabolic CFRP reflector with a 1.1 meter diameter. The results are compared to the one achieved with a high spatial resolution IR interferometer on the same reflector in laboratory conditions and under thermal vacuum conditions. This later test consists in measuring the deformations of the reflector between an initial state at a selected temperature and a final state at another temperature. The comparison between the high spatial resolution IR interferometer and this dynamic holographic method showed very good qualitative and quantitative agreement between the techniques, thus verifying the potential of this new Holographic approach.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. Thizy, Y. Stockman, D. Doyle, P. Lemaire, Y. Houbrechts, M. Georges, A. Mazzoli, E. Mazy, I. Tychon, and G. Ulbrich "Dynamic holography for the space qualification of large reflectors", Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 59650W (19 October 2005);


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