Translator Disclaimer
19 October 2005 Azimuthal ellipsometry of subsurface layer stresses of specular metallic ribbons
Author Affiliations +
Abstract
Having determined the deviations of ellipsometrical parameters for light reflected from the ribbon surface as a function of its orientation in the ribbon plane, the level of internal strain changes in the subsurface layer of Fe-based (Fe75Ni4Mo3Si2B16 and Fe70Cr15B15 ) amorphous metal alloys has been analyzed. Optical measurements were carried out for as-casted ribbons at 12 (Fe75Ni4Mo3Si2B16) and 4 (Fe70Cr15B15 ) orientations of the ribbon longitudinal axis relatively to the plane of light incidence. For each orientation phase shift Δ between p- and s-components of the polarization vector and an azimuth Ψ of the restored linear polarization have been obtained using a LEF-3M reflectometer-goniometer. From the angular dependence Δ(φ) (φ is angle of light incidence), the principal angle φ0 of light incidence was determined. Then, by rotating the sample around a normal to its surface within 360°, the polar diagrams (so-called indicatrices of ellipsometric parameters on rotation azimuth α) have been determined. The noncircular form of the polar diagram indicates a high sensitivity to internal stress variations arising during ribbon preparation. For Fe70Cr15B15 ribbons the long-time irradiation even by comparatively small fluencies of neutrons, causes structural relaxation and essentially influences on optical properties in the IR. It was determined that in the IR a real part of the complex dielectric function ε1>0 at any values φ angle of light incidence and α (azimuthal orientation of the ribbon longitudinal axis with respect to the light incidence plane).
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. V. Poperenko and M. V. Ozerov "Azimuthal ellipsometry of subsurface layer stresses of specular metallic ribbons", Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 59651T (19 October 2005); https://doi.org/10.1117/12.625137
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Metal reduction at bulk chemical filtration
Proceedings of SPIE (March 27 2017)
Impurities in solar-grade silicon
Proceedings of SPIE (January 09 2008)
Surface Anisotropy Measurements By Ellipsometry
Proceedings of SPIE (October 19 1977)

Back to Top