Paper
15 September 2005 Overview of testing and manufacturing processes for optical recordable media: industrial view
Wlodek Mischke
Author Affiliations +
Proceedings Volume 5966, Seventh International Symposium on Optical Storage (ISOS 2005); 596608 (2005) https://doi.org/10.1117/12.649599
Event: Seventh International Symposium on Optical Storage (ISOS 2005), 2005, Zhanjiang, China
Abstract
We shall give an overview of the several off-line testing methods which are recently developed. The specifics some of the methods will be described in details. Relations between the tested parameters and manufacturing process will analysed. Several indications will be described for substrates optimization, evaluation of the dyes for recordable media, control and correction of the dye distribution on the blank substrates. Relation of the dye coating with the process conditions will be described. Important process steps and their evidence in the various tested parameters on the ready media will be analysed. Further consequences of the manufacturing technology onto the performance of the final media will be discussed.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wlodek Mischke "Overview of testing and manufacturing processes for optical recordable media: industrial view", Proc. SPIE 5966, Seventh International Symposium on Optical Storage (ISOS 2005), 596608 (15 September 2005); https://doi.org/10.1117/12.649599
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Digital video discs

Manufacturing

Diffraction

Optics manufacturing

Coating

Testing and analysis

Reflectivity

RELATED CONTENT

Continuous manufacturing of thin cover sheet optical media
Proceedings of SPIE (August 13 1992)
Manufacturing CD-R media
Proceedings of SPIE (September 03 1996)
Developments in CD-R
Proceedings of SPIE (February 07 2001)
Micro-optics: manufacturing and characterization
Proceedings of SPIE (October 13 2005)

Back to Top