15 September 2005 Static testing system for blue-ray optical data storage
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Proceedings Volume 5966, Seventh International Symposium on Optical Storage (ISOS 2005); 59661U (2005) https://doi.org/10.1117/12.649806
Event: Seventh International Symposium on Optical Storage (ISOS 2005), 2005, Zhanjiang, China
Abstract
Measurement technology plays an important role in the research of optical storage. Aiming at constructing research platform for blue-ray optical data storage, we designed and built a modularized static testing system, in which laser wavelength is 406.7nm. Modulation/demodulation technique is employed to weaken the test noise. The focus move mode decreases the requirement in size of samples. And Piezoeletronic nano-positioner is used to facilitate the relocation of recording marks and improve test repeatability. Experimental results are also given to verify the performance of the static testing system.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiumin Gao, Xiumin Gao, Wedong Xu, Wedong Xu, Fuxi Gan, Fuxi Gan, Fei Zhou, Fei Zhou, } "Static testing system for blue-ray optical data storage", Proc. SPIE 5966, Seventh International Symposium on Optical Storage (ISOS 2005), 59661U (15 September 2005); doi: 10.1117/12.649806; https://doi.org/10.1117/12.649806
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