Estimating a life expectancy of high-density recordable optical disks

Yoshihiro Okino; Mitsuru Irie; Takahiro Kubo; Masahiro Okuda

doi:10.1117/12.649815

15 September 2005 Estimating a life expectancy of high-density recordable optical disks

Yoshihiro Okino, Mitsuru Irie, Takahiro Kubo, Masahiro Okuda

Author Affiliations +

Proceedings Volume 5966, Seventh International Symposium on Optical Storage (ISOS 2005); 59661Z (2005) https://doi.org/10.1117/12.649815
Event: Seventh International Symposium on Optical Storage (ISOS 2005), 2005, Zhanjiang, China

Abstract

We examine a lifetime estimation method for high-density recordable optical disks. It is based on the Eyring acceleration model and statistical analysis. The statistical distribution of life data for the optical disk assumed a lognormal distribution. The standardized life expectancy of an optical disk is defined as the minimum lifetime of 95% survival probability at 25°C / 50%RH with a 95% confidence level. An acceleration test was conducted under stress conditions of temperature and relative humidity. Results have demonstrated that the statistical distribution of lifetime data using the digital error criterion item can be applied to a lognormal distribution. Thereby, we can estimate a standard life expectancy of high-density recordable optical disks as the minimum lifetime of 95% survival probability at a 95% confidence level.

Citation Download Citation

Yoshihiro Okino, Mitsuru Irie, Takahiro Kubo, and Masahiro Okuda "Estimating a life expectancy of high-density recordable optical disks", Proc. SPIE 5966, Seventh International Symposium on Optical Storage (ISOS 2005), 59661Z (15 September 2005); https://doi.org/10.1117/12.649815

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