Low Energy X-Ray Transmission Grating Spectrometer For AXAF

A. C. Brinkman; J. J. van Rooijen; J. A. M. Bleeker; J. H. Dijkstra; J. Heise; P. A. J. de Korte; R. Mewe; F. Paerels

doi:10.1117/12.966587

14 July 1986 Low Energy X-Ray Transmission Grating Spectrometer For AXAF

A. C. Brinkman, J. J. van Rooijen, J. A. M. Bleeker, J. H. Dijkstra, J. Heise, P. A. J. de Korte, R. Mewe, F. Paerels

Proceedings Volume 0597, X-Ray Instrumentation in Astronomy; (1986) https://doi.org/10.1117/12.966587
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

The proposed grating spectrometer for the Advanced X-Ray Astrophysics Facility (AXAF) covers the wavelength region between 2 and 140 Å. The wavelength resolution Δλ = 0.05 Å. The effective sensitive area as a function of wavelength is discussed. To illustrate the expected performance of the spectrometer some simulated spectra of a few interesting astrophysical objects are presented.

Citation Download Citation

A. C. Brinkman, J. J. van Rooijen, J. A. M. Bleeker, J. H. Dijkstra, J. Heise, P. A. J. de Korte, R. Mewe, and F. Paerels "Low Energy X-Ray Transmission Grating Spectrometer For AXAF", Proc. SPIE 0597, X-Ray Instrumentation in Astronomy, (14 July 1986); https://doi.org/10.1117/12.966587

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