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14 December 2005 Numerical analysis of forces in optical tweezers in the Rayleigh regime
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Proceedings Volume 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II; 597205 (2005) https://doi.org/10.1117/12.639430
Event: Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 2004, Bucharest, Romania
Abstract
In this work we present a numerical evaluation of the forces in an optical tweezers system, for metallic nanoparticles in the Rayleigh regime. Initially a Gaussian beam is described in the scalar approximation, and the forces it can apply on Rayleigh dielectric and metallic particles are computed within the point-dipole approach. The method is then extended to dielectric and metallic Rayleigh particles in a Laguerre-Gaussian beam, i.e. a higher order beam that is increasingly used for optical trapping experiments. We discuss the limits of the approximation for the beam intensity by comparing the numerical results with the experimental measurements that can be found in literature.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. Garbin, D. Cojoc, R. Kulkarni, R. Malureanu, E. Ferrari, M. Nadasan, and E. Di Fabrizio "Numerical analysis of forces in optical tweezers in the Rayleigh regime", Proc. SPIE 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 597205 (14 December 2005); https://doi.org/10.1117/12.639430
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