7 December 2006 The X pinch as an x-ray source for point-projection radiography
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Proceedings Volume 5974, International Conference on Charged and Neutral Particles Channeling Phenomena; 59740L (2006) https://doi.org/10.1117/12.639993
Event: International Conference on Charged and Neutral Particles Channeling Phenomena, 2004, Rome, Italy
Abstract
Two methods of using the X pinch as a source of X-ray radiation for the radiography of dense plasmas and other objects are presented. These methods do not use pinholes, instead taking advantage of the small source size (<1 mm, and in some cases <1 pm) and short X-ray emission duration (< 2 ns , and < 20 ps in some cases) of the X pinch radiation. Detailed measurements of the emission characteristics of X pinches made using different wire materials and in different energy ranges using a set of X-ray diagnostics with high temporal and spatial resolution are presented. Several applications of the X pinch are discussed.
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S. A. Pikuz, S. A. Pikuz, T. A. Shelkovenko, T. A. Shelkovenko, A. R. Mingaleev, A. R. Mingaleev, V. M. Romanova, V. M. Romanova, B. M. Song, B. M. Song, K. M. Chandler, K. M. Chandler, M. D. Mitchell, M. D. Mitchell, D. A. Hammer, D. A. Hammer, } "The X pinch as an x-ray source for point-projection radiography", Proc. SPIE 5974, International Conference on Charged and Neutral Particles Channeling Phenomena, 59740L (7 December 2006); doi: 10.1117/12.639993; https://doi.org/10.1117/12.639993
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