Translator Disclaimer
Paper
16 July 1986 Information- And Image-Processing Of Scanning-Tunneling-Microscope Data
Author Affiliations +
Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952414
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Scanning Tunneling Microscopy (STM) gives information on the topography, chemical composition and electronic structure of metal and semiconductor surfaces down to the atomic scale. The experimental data can be filtered using a Wiener-type or least-square filter to eliminate blurring, to suppress noise, and, in addition, to correct spatial distortions by correlating typical picture elements. The three-dimensional profile of the processed surface picture can then be represented according to techniques developed by map-makers.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Stoll "Information- And Image-Processing Of Scanning-Tunneling-Microscope Data", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); https://doi.org/10.1117/12.952414
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT


Back to Top