Application of near infrared spectroscopy to predict plant diseases

Huirong Xu; Yibin Ying; Zunzhong Ye

doi:10.1117/12.628458

8 November 2005 Application of near infrared spectroscopy to predict plant diseases

Huirong Xu, Yibin Ying, Zunzhong Ye

Proceedings Volume 5996, Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality; 59960A (2005) https://doi.org/10.1117/12.628458
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

The objectives of this study were to characterize leaf reflectance spectra of tomato leaves damaged by leaf miner and to determine those leaf reflectance wavelengths that were most responsive to plant damage caused by the pest. Near infrared (NIR) Spectral characteristics of single tomato leaves at various levels of infestation by the leaf miner, were measured and analyzed using a spectrometer. Tomato leaf damage was classified into five scales, i.e., 0 (no damage), 1 (light damaged), 2 (10-25% damaged), 3 (more than 25% damaged), and 4 (severe damaged), based on the scale of infestation displayed on the surfaces of plant parts. Spectral parameter such as reflectance sensitivity was used to find the optimal wavelengths to determining and evaluating the damage level. Results showed that there were significant differences in reflectance among infestations at wavelengths of 1450nm and 1900 nm particularly. The determining coefficients (R²) for a linear relationship were 0.98 and 0.91 for the spectral-infestation levels relations. Thus, both of these wavelengths were good indicators of leaf senescence caused by the leaf miner.

Citation Download Citation

Huirong Xu, Yibin Ying, and Zunzhong Ye "Application of near infrared spectroscopy to predict plant diseases", Proc. SPIE 5996, Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality, 59960A (8 November 2005); https://doi.org/10.1117/12.628458

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