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A contrast between DLP and LCD digital projection technology for triangulation based phase measuring optical profilometers
Three-dimensional shape measurement using focus method by using liquid crystal grating and liquid varifocus lens
Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases
Nanometrology device standards for scanning probe microscopes and processes for their fabrication and usage
Characterization and integrity testing of flexible film materials utilizing a unique corona beam technology