You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
7 November 2005Fast grey-level co-occurrence matrix calculations for texture analysis
Characterizing the surface texture of objects or moving webs is sometimes important in identifying and/or determining the quality of products. Fourier analysis is often used for this in laboratory situations, but inspection algorithms using the FFT are too slow for many production situations, even when implemented on fast computers. An alternative technique pioneered in the 1970s by Haralick [1] operates in the time domain and uses grey-level cooccurrence matrices (GLCMs) as a first step toward obtaining useful measures characterizing textures. Although the GLCM approach is much less computationally-intensive than the FFT, it nonetheless requires massive amounts of calculation. Most of this computation time is spent in stepping through the input image and compiling the matrices themselves. Therefore, if the calculation time for these matrices could be reduced, the GLCM technique would become more practical. This paper applies the SKIPSM paradigm to the calculation of GLCMs, and provides execution times for this implementation.
The alert did not successfully save. Please try again later.
Frederick M. Waltz, John W. V. Miller, "Fast grey-level co-occurrence matrix calculations for texture analysis," Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 600004 (7 November 2005); https://doi.org/10.1117/12.634764