7 November 2005 A new wavelet sub-band characterization for texture recognition
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Proceedings Volume 6001, Wavelet Applications in Industrial Processing III; 60010A (2005) https://doi.org/10.1117/12.629333
Event: Optics East 2005, 2005, Boston, MA, United States
Abstract
Our article presents a new way to characterize texture : Wavelet Geometrical Features, that extracts structural measurements from wavelet sub-bands, when most of the wavelet-based methods found in the litterature use only statistical ones. We first describe the method used to compute our features, and thereafter compare them to thirteen other standard texture features in a classification experiment on the whole Brodatz texture database. We showed that our method produces the best results, especially over the wavelet energy signature and the method it originated from, the Statistical Geometrical Features of Chen.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
François Mourougaya, François Mourougaya, Philippe Carré, Philippe Carré, Christine Fernandez-Maloigne, Christine Fernandez-Maloigne, } "A new wavelet sub-band characterization for texture recognition", Proc. SPIE 6001, Wavelet Applications in Industrial Processing III, 60010A (7 November 2005); doi: 10.1117/12.629333; https://doi.org/10.1117/12.629333
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