Scaling of the microwave and dc conductance of metallic single-walled carbon nanotubes

Zhen Yu; Chris Rutherglen; Peter J. Burke

doi:10.1117/12.631867

12 November 2005 Scaling of the microwave and dc conductance of metallic single-walled carbon nanotubes

Zhen Yu, Chris Rutherglen, Peter J. Burke

Proceedings Volume 6003, Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems; 60030Q (2005) https://doi.org/10.1117/12.631867
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

We measure the dynamical conductance of electrically contacted single-walled carbon nanotubes at dc and ac as a function of source-drain voltage in both low and high dc bias voltage. We show a direct relationship between the ac conductance and dc conductance. We also measure the microwave conductance of 2 nanotubes in parallel and observe an anomalous frequency dependence.

Citation Download Citation

Zhen Yu, Chris Rutherglen, and Peter J. Burke "Scaling of the microwave and dc conductance of metallic single-walled carbon nanotubes", Proc. SPIE 6003, Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems, 60030Q (12 November 2005); https://doi.org/10.1117/12.631867

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