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17 November 2005 Investigations on adsorption-dependent optical thickness changes of molecular sieve zeolite thin films for chemical sensor development
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Proceedings Volume 6008, Nanosensing: Materials and Devices II; 60081H (2005) https://doi.org/10.1117/12.630184
Event: Optics East 2005, 2005, Boston, MA, United States
Abstract
Molecular sieve zeolites are capable of selectively adsorbing molecular species into their nanoporous structures. Using whitelight interferometry, the changes in optical thickness of b-oriented MFI zeolite thin films have been measured as a function of organic vapor partial pressure in the surrounding environment. The adsorption induced optical thickness changes of the oriented MFI zeolite films were found to be reversible and monotonically dependent on the organic concentration level. The quantitative results of this study are useful for designing optical fiber-based chemical sensors for in-situ detections.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juan Hui, Liangxiong Li, Jian Zhang, Ming Luo, Junhang Dong, and Hai Xiao "Investigations on adsorption-dependent optical thickness changes of molecular sieve zeolite thin films for chemical sensor development", Proc. SPIE 6008, Nanosensing: Materials and Devices II, 60081H (17 November 2005); https://doi.org/10.1117/12.630184
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