5 December 2005 Resilience in all-optical label switching networks: a node dimensioning point of view
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Proceedings Volume 6022, Network Architectures, Management, and Applications III; 602228 (2005) https://doi.org/10.1117/12.634757
Event: Asia-Pacific Optical Communications, 2005, Shanghai, China
Abstract
This paper deals with resilience in all-optical networks. The main disadvantage when designing all-optical label swapping networks is the enormous dimensions an all-optical node can have. The node's size relates directly to the number of Label Switched Paths passing through the node. In this paper, we discuss how the dimensions of the all-optical node alter when introducing resilience in label swapping and stripping networks. We compare the node dimensions for different recovery strategies and different all-optical networking approaches.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ruth Van Caenegem, Ruth Van Caenegem, Didier Colle, Didier Colle, Mario Pickavet, Mario Pickavet, Piet Demeester, Piet Demeester, "Resilience in all-optical label switching networks: a node dimensioning point of view", Proc. SPIE 6022, Network Architectures, Management, and Applications III, 602228 (5 December 2005); doi: 10.1117/12.634757; https://doi.org/10.1117/12.634757
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