9 December 2005 Development and application of a novel crop stress and quality instrument
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Proceedings Volume 6024, ICO20: Optical Devices and Instruments; 60241I (2005) https://doi.org/10.1117/12.666863
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
In this paper, a portable diagnostic instrument for crop quality analysis was designed and tested, which can measure the normalized difference vegetation index (PRI) and structure insensitive pigment index (NRI) of crop canopy in the field. The instrument have a valid survey area of 1m×1m when the height between instrument and the ground was fixed to 1.3 meter. The crop quality can be assessed based on their PRI and NRI values, so it will be very important for crop management to get these values. The instrument uses sunlight as its light source. There are six special different photoelectrical detectors within red, blue and near infrared bands, which are used for detecting incidence sunlight and reflex light from the canopy of crop. This optical instrument includes photoelectric detector module, signal process and A/D convert module, the data storing and transmission module and human-machine interface module. The detector is the core of the instrument which measures the spectrums at special bands. The microprocessor calculates the NDVI and SIPI value based on the A/D value. And the value can be displayed on the instrument's LCD, stored in the flash memory of instrument and can also be uploaded to PC through the PC's RS232 serial interface. The prototype was tested in the crop field at different view directions. It reveals the on-site and non-sampling mode of crop growth monitoring by fixed on the agricultural machine traveling in the field. Such simple instruments can diagnose the plant growth status by the acquired spectral response.
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Wengjiang Huang, Wengjiang Huang, Gang Sun, Gang Sun, Jihua Wang, Jihua Wang, Liangyun Liu, Liangyun Liu, Wengang Zheng, Wengang Zheng, } "Development and application of a novel crop stress and quality instrument", Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 60241I (9 December 2005); doi: 10.1117/12.666863; https://doi.org/10.1117/12.666863
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