A new instrument for fiber connector endface measurement

Zongtao Ge; Fumio Kobayashi

doi:10.1117/12.666950

9 December 2005 A new instrument for fiber connector endface measurement

Zongtao Ge, Fumio Kobayashi

Proceedings Volume 6024, ICO20: Optical Devices and Instruments; 602425 (2005) https://doi.org/10.1117/12.666950
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China

Abstract

A new instrument for measuring end surface geometrical parameters of APC connectors is described. In this apparatus, a Mirau type interferometric objective is employed to measure a small area of the connector end surface and generate interferogram corresponding to the surface profile. Various new technologies are used to ensure high performance and high measurement repeatability. A multi-point method is proposed to adjust the inclination of the PC sample stage. APC angle of the sample stage is adjusted directly on the instrument using a special tool whose angle is calibrated by using the reversal method. Measurement results of important parameters of fiber connector end faces are compared with those inspected by commercial profiler or a standard sample. Optical insertion losses of connectors inspected by the developed system are also evaluated.

Citation Download Citation

Zongtao Ge and Fumio Kobayashi "A new instrument for fiber connector endface measurement", Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 602425 (9 December 2005); https://doi.org/10.1117/12.666950

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