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7 February 2006 Analysis of the throughput of onboard polarization interference imaging spectrometer
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Proceedings Volume 6032, ICO20: MEMS, MOEMS, and NEMS; 60320T (2006) https://doi.org/10.1117/12.667886
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
The mechanism of beam shearing splitting and principle of the interfering imaging of the self-developed onboard Polarization Interference Imaging Spectrometer (PIIS) were expounded in this paper. The throughput of PIIS is analyzed. The relation of the throughput with the angle of the polarized orientation of the polarizer to the ideal direction is derived. This Polarization Interference Imaging Spectrometer has the merit of simple structure, no moving parts, and high throughput. Because of its unique advantage of static, compact in size, wide field of view, it is applicable for the aviation, spaceflight, remote sensing, fieldwork or weak signal detection.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chunmin Zhang, Baochang Zhao, Yan Yuan, and Jian He "Analysis of the throughput of onboard polarization interference imaging spectrometer", Proc. SPIE 6032, ICO20: MEMS, MOEMS, and NEMS, 60320T (7 February 2006); https://doi.org/10.1117/12.667886
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