21 March 2006 The board implementation of AVR microcontroller checking for single event upsets
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Proceedings Volume 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials; 60401I (2006) https://doi.org/10.1117/12.664224
Event: ICMIT 2005: Merchatronics, MEMS, and Smart Materials, 2005, Chongqing, China
Abstract
Radiation hardening parts are to be used for satellites and nuclear power plants due to various kinds of radiation particles in space and radiation environment. Here, our focus is to implement a testing board of AVR Microcontroller checking for Single Event Upsets (SEU); the effects of protons on the electronic devices. The SEU results form the level change of stored information due to photon radiation and temperature in the space environment. The impact of SEU on PLD (Programmable Logic Devices) technology is most apparent in SRAM/ROM/DRAM devices wherein the state of storage cell can be upset. In this research, a simple and powerful test technique is suggested, and the results are presented for the analysis and future reference. In our experiment, the proton radiation facility (having the energy of 30 MeV with a beam current of 20 uA in the cyclotron) available at KIRAMS (Korea Institute of Radiological Medical Sciences) has been applied on two kinds of commercially available SRAM and EEPROM.
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Young Hwan Lho, Young Hwan Lho, Dae Jin Jang, Dae Jin Jang, Kang Kuk Seo, Kang Kuk Seo, Jae Ho Jung, Jae Ho Jung, Ki Yup Kim, Ki Yup Kim, } "The board implementation of AVR microcontroller checking for single event upsets", Proc. SPIE 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials, 60401I (21 March 2006); doi: 10.1117/12.664224; https://doi.org/10.1117/12.664224
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