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3 November 2005 An efficient detect model for crosstalk faults on SOC interconnects
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Proceedings Volume 6043, MIPPR 2005: SAR and Multispectral Image Processing; 60432L (2005) https://doi.org/10.1117/12.655019
Event: MIPPR 2005 SAR and Multispectral Image Processing, 2005, Wuhan, China
Abstract
As System-on-Chip (SOC) manufacture technology moves into ultra deep sub-micron (DSM) ear, Crosstalk faults between SoC interconnect result in improper function of the chip. This problem is becoming more and more severe. Based on the in-depth research of the property of crosstalk fault and the MAF model, we presented a simple and efficient model: the Search-Based Maximal Aggressor Fault (SB-MAF) for detecting glitch and delay faults caused by crosstalk effects on interconnects between components of a SOC. The respective efficiency of the presented model and the MAF model is given in the paper. The results of simulation show that two models' efficiency is comparable when crosstalk is weak. However, the efficiency of the SB-MAF model is obviously improved compare to the MAF model when there are strong crosstalk effects between SoC interconnects.
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Jinlin Zhang, Chaoyang Chen, and Xubang Shen "An efficient detect model for crosstalk faults on SOC interconnects", Proc. SPIE 6043, MIPPR 2005: SAR and Multispectral Image Processing, 60432L (3 November 2005); https://doi.org/10.1117/12.655019
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