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10 February 2006 Young's modulus determination of new polymeric materials using optical techniques
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Proceedings Volume 6046, Fifth Symposium Optics in Industry; 604610 (2006) https://doi.org/10.1117/12.674476
Event: Fifth Symposium Optics in Industry, 2005, Santiago De Queretaro, Mexico
Abstract
It is described an Electronic Speckle Pattern Interferometer (ESPI) used for Young's modulus measuring of a new PVC material. The technique considers the construction of a small tensile testing machine that is good enough to apply loads on the polymeric specimens. A dual-illumination ESPI system is built up to measure specimen in-plane micro-displacements under the tension loads. For Young's modulus measuring, strain is required and determined by the force per area unit. Since the specimens have irregular traversal section, the self-imaging or Talbot-projected fringe technique is implemented for determining such a transversal section all along the specimen. Experimental results by using these optical techniques are shown, as well as, the measure of a new polymer Young's modulus.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Rodriguez-Vera, J. A. Rayas, Amalia Martinez, O. Rodriguez, and I. G. Yañez "Young's modulus determination of new polymeric materials using optical techniques", Proc. SPIE 6046, Fifth Symposium Optics in Industry, 604610 (10 February 2006); https://doi.org/10.1117/12.674476
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