10 February 2006 Low-scale displacement sensor (multiple unities)
Author Affiliations +
Proceedings Volume 6046, Fifth Symposium Optics in Industry; 60462D (2006) https://doi.org/10.1117/12.674660
Event: Fifth Symposium Optics in Industry, 2005, Santiago De Queretaro, Mexico
Throughout all this paper we are going to analyze one application of the optical beam deflection method, the procedure for its development, as well as its ideal implementation to reach measurements of displacements that could be the most accurate and of the smaller scale possible, this condition is essential for the magnitude of the results to evaluate. We also give and introduction of the optical beam deflection method, it is characteristics and some of their latest applications as an auxiliary technique on research and commercial fields. This present work will be analyzed the laser beam deflection technique, the procedure to apply, as well as its ideal implementation in order to obtain measures of displacements that can sense to the most exact and of smaller possible scale, obtaining results from microns, micrometers and until nanometers. The importance of this work resides in that the technique although is simple and has easy implementation, the results that can hurtle they are very reliable; thanks to it, the laser beam method of deflection has been not only diffused in many fields of the science and the technology of the optics, but also in those where its application is innovating. This has ended up being a technique of huge utility on interdisciplinary use and has been used to measure physical parameters in a great variety of experiments.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Angélica Ramírez-Ibarra, Angélica Ramírez-Ibarra, G. Eduardo Sandoval-Romero, G. Eduardo Sandoval-Romero, Augusto García-Valenzuela, Augusto García-Valenzuela, Salvador Palma-Vargas, Salvador Palma-Vargas, "Low-scale displacement sensor (multiple unities)", Proc. SPIE 6046, Fifth Symposium Optics in Industry, 60462D (10 February 2006); doi: 10.1117/12.674660; https://doi.org/10.1117/12.674660


Novel optical refraction index sensor
Proceedings of SPIE (September 23 2011)
Printing: here and now electronic full color
Proceedings of SPIE (March 28 1996)
Fast parallel acquisition electron energy analyzer
Proceedings of SPIE (November 14 1999)
Densimeter of fine particles based in an optical sensor of...
Proceedings of SPIE (September 07 2006)

Back to Top