Non-contact measuring system in sinusoidal phase modulating interferometry using a laser diode

Ki-Young Pyo; Geun-Young Lee; Weon-Jae Ryu; Young-June Kang; Nak-Kyu Park

doi:10.1117/12.649086

6 December 2005 Non-contact measuring system in sinusoidal phase modulating interferometry using a laser diode

Ki-Young Pyo, Geun-Young Lee, Weon-Jae Ryu, Young-June Kang, Nak-Kyu Park

Proceedings Volume 6051, Optomechatronic Machine Vision; 60510H (2005) https://doi.org/10.1117/12.649086
Event: Optomechatronic Technologies 2005, 2005, Sapporo, Japan

Abstract

Recently, laser interferometry is widely used as a measuring system in many fields because of its high resolution and its ability to measure a broad area in real-time all at once. In conventional laser interferometry, for example Out-of-plane ESPI (Electronic Speckle Pattern Interferometry), In plane ESPI, Shearography and Holography, it uses PZT or other components as a phase shift instrumentation to extract 3-D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include nonlinear errors and limited time of use. In the present study, a new type of laser interferometry using a laser diode is proposed. Using Laser Diode Sinusoidal Phase Modulating (LD-SPM) interferometry, the phase modulation can be directly modulated by controlling the laser diode injection current thereby eliminating the need for PZT and its components. This makes the interferometry more compact.

Citation Download Citation

Ki-Young Pyo, Geun-Young Lee, Weon-Jae Ryu, Young-June Kang, and Nak-Kyu Park "Non-contact measuring system in sinusoidal phase modulating interferometry using a laser diode", Proc. SPIE 6051, Optomechatronic Machine Vision, 60510H (6 December 2005); https://doi.org/10.1117/12.649086

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