Paper
26 January 2006 Three-dimensional surface reconstruction for evaluation of the abrasion effects on textile fabrics
A. O. Mendes, P. T. Fiadeiro, R. A. L. Miguel
Author Affiliations +
Proceedings Volume 6056, Three-Dimensional Image Capture and Applications VII; 60560F (2006) https://doi.org/10.1117/12.640438
Event: Electronic Imaging 2006, 2006, San Jose, California, United States
Abstract
Abrasion is responsible for many surface changes that occur on garments. For this reason, the evaluation of its effects becomes very important for the textile industry. In particular, pilling formation is a phenomenon that results of the abrasion process and affects fabrics more significantly altering their surface severely. The present work presents a method based on optical triangulation that enables topographic reconstructions of textile fabric samples and consequently, makes possible the evaluation and the quantification of the pilling formation that results from their topographic changes. Specific algorithms, written in the MatLab programming language, were developed and implemented to control the image data acquisition, storage and processing procedures. Finally, with the available processed data was possible to reconstruct the surface of fabric samples in three-dimensions and also, a coefficient to express the pilling formation occurred on the analyzed fabrics was achieved. Several tests and experiences have been carried out and the obtained results shown that this method is robust and precise.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. O. Mendes, P. T. Fiadeiro, and R. A. L. Miguel "Three-dimensional surface reconstruction for evaluation of the abrasion effects on textile fabrics", Proc. SPIE 6056, Three-Dimensional Image Capture and Applications VII, 60560F (26 January 2006); https://doi.org/10.1117/12.640438
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Cited by 4 scholarly publications.
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KEYWORDS
Sensors

Image sensors

Data acquisition

CCD cameras

Statistical analysis

CCD image sensors

Error analysis

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