6 February 2006 CCD small signal characterization using fluoresce x rays
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Past and present revelations within scientific imaging have stressed the importance of CCD small signal sensitivity. Current characterization techniques use a Fe55 soft x-ray source to determine charge transfer and noise, however rendering signal sensitivity less than 1620 e- unknown. CCD evolution has brought forth innovative design and fabrication techniques to decrease device noise and increase device sensitivity, enabling low level imaging. This paper presents a simple approach to characterizing the transfer functions, linearity, noise, and output sensitivity at low signal levels, thus confirming the true capabilities of the imager. This characterization technique also validates the quality of the base material and process via low level trap testing. The characterization method uses fluoresce x-rays from target materials to illuminate the imager.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kasey Boggs, Kasey Boggs, } "CCD small signal characterization using fluoresce x rays", Proc. SPIE 6068, Sensors, Cameras, and Systems for Scientific/Industrial Applications VII, 60680T (6 February 2006); doi: 10.1117/12.644326; https://doi.org/10.1117/12.644326

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