Paper
15 February 2006 A two-factor error model for quantitative steganalysis
Author Affiliations +
Proceedings Volume 6072, Security, Steganography, and Watermarking of Multimedia Contents VIII; 607206 (2006) https://doi.org/10.1117/12.643701
Event: Electronic Imaging 2006, 2006, San Jose, California, United States
Abstract
Quantitative steganalysis refers to the exercise not only of detecting the presence of hidden stego messages in carrier objects, but also of estimating the secret message length. This problem is well studied, with many detectors proposed but only a sparse analysis of errors in the estimators. A deep understanding of the error model, however, is a fundamental requirement for the assessment and comparison of different detection methods. This paper presents a rationale for a two-factor model for sources of error in quantitative steganalysis, and shows evidence from a dedicated large-scale nested experimental set-up with a total of more than 200 million attacks. Apart from general findings about the distribution functions found in both classes of errors, their respective weight is determined, and implications for statistical hypothesis tests in benchmarking scenarios or regression analyses are demonstrated. The results are based on a rigorous comparison of five different detection methods under many different external conditions, such as size of the carrier, previous JPEG compression, and colour channel selection. We include analyses demonstrating the effects of local variance and cover saturation on the different sources of error, as well as presenting the case for a relative bias model for between-image error.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rainer Böhme and Andrew D. Ker "A two-factor error model for quantitative steganalysis", Proc. SPIE 6072, Security, Steganography, and Watermarking of Multimedia Contents VIII, 607206 (15 February 2006); https://doi.org/10.1117/12.643701
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Cited by 33 scholarly publications.
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KEYWORDS
Error analysis

Sensors

Remote sensing

Steganalysis

Image compression

Raster graphics

Statistical analysis

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