Layer dependent refractive index measurement by Fourier domain optical coherence tomography

Peter H. Tomlins; Ruikang K. Wang

doi:10.1117/12.645719

20 February 2006 Layer dependent refractive index measurement by Fourier domain optical coherence tomography

Peter H. Tomlins, Ruikang K. Wang

Proceedings Volume 6079, Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X; 607913 (2006) https://doi.org/10.1117/12.645719
Event: SPIE BiOS, 2006, San Jose, California, United States

Abstract

In this article we present a novel approach to quantitative imaging by Fourier domain optical coherence tomography. Using an eigenanalysis technique, a matrix model of the sample under test is fitted to real spectral data to extract layer dependent refractive index and thickness values. We demonstrate this method experimentally for a simple test artefact, made from silica test slides and highly scattering dental composite.

Citation Download Citation

Peter H. Tomlins and Ruikang K. Wang "Layer dependent refractive index measurement by Fourier domain optical coherence tomography", Proc. SPIE 6079, Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X, 607913 (20 February 2006); https://doi.org/10.1117/12.645719

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